AIIM 2003 Exposition & Conference - KAB Scanning Resources Recap

KAB Scanning Resources, LLC

Solutions for small and large businesses

The following page contains pictures of the AIIM 2003 Exposition and Conference in New York City. KAB Scanning Resources was joined at that show by partners J&K Imaging and Microform GmbH , for whom KAB represents in the North and South American territories, to exhibit their cutting edge expertise, technology and equipment - "all under one umbrella." Click on each picture to enlarge
	The Microform team takes time out from the show to pose with the Agfa ADMIS S61 Scanner
Roland Reinberger (Microform) and KAB Scanning Resources CEO, Kurt A. Boehni, review the show plans
	Kurt Boehni and Vice President of Marketing and Sales, J.W. Cannon talk to passerby's and hand out mini umbrellas to interested parties
Walter Bartke prepares his documents to showcase the amazing speed of the Agfa S61
	The booth team shows off the S61 to an interested customer
The Agfa ADMIS S61 speedometer, showing speeds of over 1000 images per minute currently being scanned - just try and find another that fast with this handling capability!
	It's so fast, it appears that Wolfgang Urban of Microform even has trouble keeping up! Here he is utilizing the unique "bypass" function of the scanner.
Okay, someone is taking this "all under one umbrella" thing too far. Well, it did snow 6 inches while the show was going on in New York........
	Showcasing it's high end, front end color capture software, DpuScan, J&K Imaging used the Kodak i840 color scanner, currently the fastest in the marketplace at 150 ppm.
Kurt Boehni looks on as President of Janich & Klass Computertechnik GmbH (J&K Imaging), Dietmar Janich prepares a DpuScan demo for an interested customer
	The show finally over, the KAB Scanning Resources, Microform and J&K Imaging teams pose for a photo before returning home.